This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Jeol Ltd.. Active years: 2006-2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006-2008
Title: Joachim Zach - Innovator in Charged-Particle Beam Technology
Introduction
Joachim Zach is a prominent inventor based in Heidelberg, Germany. He has made significant contributions to the field of charged-particle beam technology, holding a total of 3 patents. His work focuses on methods and apparatuses that enhance the precision and efficiency of charged-particle beams.
Latest Patents
Zach's latest patents include a "Method and apparatus for automatically correcting charged-particle beam" and a "Method of controlling aberration corrector for charged-particle beam." These innovations disclose a method and apparatus for automatically correcting a charged-particle beam with an aberration corrector, eliminating the need for manual operations by the operator. The apparatus features an extraction portion that captures the beam profile from images of a sample's surface, a calculation unit that determines the axial deviation of the apparatus from the extracted profile, and a feedback unit that automatically adjusts the aberration corrector or objective lens based on the calculated deviation. Additionally, he has developed an "Automated method of correcting aberrations in electron beam," which utilizes a computer to correct various types of aberrations, including axis deviation, defocus, chromatic aberration, and aperture aberration.
Career Highlights
Joachim Zach is currently associated with Jeol Ltd., a company known for its advanced electron microscopy and imaging technologies. His work at Jeol Ltd. has positioned him as a key player in the development of innovative solutions for charged-particle beam applications.
Collaborations
Throughout his career, Zach has collaborated with notable colleagues, including Natsuko Nakamura and Kazuhiro Honda. These collaborations have further enriched his research and development efforts in the field.
Conclusion
Joachim Zach's contributions to charged-particle beam technology exemplify his innovative spirit and dedication to advancing scientific knowledge. His patents reflect a commitment to improving the accuracy and efficiency of charged-particle beam applications, making a lasting impact in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile