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For the Inventor, By the Inventor

Kumagaya, Japan

Jiro Inoue

USPTO Granted Patents = 11

 

Average Co-Inventor Count = 3.7

ph-index = 5

Forward Citations = 105(Granted Patents)


Location History:

  • Kawasaki, JP (2002)
  • Kanagawa-ken, JP (2002 - 2003)
  • Kumagaya, JP (2004 - 2017)
  • Yokohama, JP (2018)

Company Filing History:

goldMedal11 out of 8,889 
 
Nikon Corporation
 patents
silverMedal1 out of 1,278 
 
The University of Tokyo
 patents
where one patent can have more than one assignee

Years Active: 2002-2018

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11 patents (USPTO):
1. 10113948 - Particle detection method, particle detection device and particle detection system (2018-10-30),
2. 9846371 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2017-12-19),
3. 9268237 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2016-02-23),
4. 9019467 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2015-04-28),
5. 8384880 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2013-02-26),
6. 8208117 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2012-06-26),
7. 7483119 - Exposure method, substrate stage, exposure apparatus, and device manufacturing method (2009-01-27),
8. 6788393 - Stage unit and exposure apparatus (2004-09-07),
9. 6535272 - Position transducer and exposure apparatus with same (2003-03-18),
10. 6384898 - Projection exposure apparatus (2002-05-07),
11. 6342941 - Exposure apparatus and method preheating a mask before exposing; a conveyance method preheating a mask before exposing; and a device manufacturing system and method manufacturing a device according to the exposure apparatus and method (2002-01-29),

Title: Jiro Inoue: Innovator in Particle Detection Technology

Introduction

Jiro Inoue is a prominent inventor based in Kumagaya, Japan, known for his significant contributions to the field of particle detection technology. With a total of 11 patents to his name, Inoue has developed innovative methods and devices that enhance the detection and analysis of particles in various applications.

Latest Patents

Inoue's latest patents include a particle detection method, a particle detection device, and a particle detection system. The particle detection method involves a process where particles in a sample are detected through a series of steps. This includes mounting a fluid device on a stage portion, irradiating the channel with illumination light, and detecting the scattered light generated from the particles. The illumination light is specifically converged to enter the channel through only the first side surface that faces the incident direction of the light. Another notable patent is an exposure apparatus designed to expose a substrate by projecting a pattern image onto it through a liquid. This apparatus features a projection optical system and a movable member, which is equipped with a liquid-repellent member that is detachably provided.

Career Highlights

Throughout his career, Jiro Inoue has worked with esteemed organizations such as Nikon Corporation and the University of Tokyo. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking advancements in technology.

Collaborations

Inoue has collaborated with notable colleagues, including Soichi Owa and Nobutaka Magome. These partnerships have fostered an environment of innovation and creativity, leading to the development of advanced technologies in particle detection.

Conclusion

Jiro Inoue's work in particle detection technology exemplifies the impact of innovative thinking in scientific research. His patents and collaborations highlight his commitment to advancing the field and improving detection methods.

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