This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Beijing University of Technology. Active years: 2018-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018-2022
Title: Jingpin Jiao: Innovator in Electromagnetic Detection Methods
Introduction
Jingpin Jiao is a prominent inventor based in Beijing, China. He has made significant contributions to the field of nondestructive testing and electromagnetic detection. With a total of 3 patents, his work focuses on innovative methods for assessing material integrity.
Latest Patents
One of Jingpin Jiao's latest patents is a low-frequency electromagnetic detection method for large-scale damage of ferromagnetic materials based on broadband excitation. This invention provides a novel approach to detect defects in ferromagnetic components by analyzing the magnetic field signals. The method effectively characterizes material damage and reduces the influence of magnetic field skin effects.
Another notable patent is the non-linear Lamb wave mixing method for measuring stress distribution in thin metal plates. This technique is designed for stress detection and positioning stress concentration areas in plate structures. By utilizing nonlinear Lamb wave mixing, the method allows for precise measurements of stress distribution in metal plates.
Career Highlights
Jingpin Jiao is affiliated with the Beijing University of Technology, where he continues to advance research in his field. His innovative approaches have garnered attention and recognition within the scientific community.
Collaborations
Jingpin has collaborated with notable colleagues, including Cunfu He and Bin Wu. Their joint efforts contribute to the advancement of nondestructive testing technologies.
Conclusion
Jingpin Jiao's work exemplifies the spirit of innovation in the field of electromagnetic detection. His patents reflect a commitment to improving material assessment techniques, making significant strides in nondestructive testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
