The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Apr. 29, 2020
Beijing University of Technology, Beijing, CN;
BEIJING UNIVERSITY OF TECHNOLOGY, Beijing, CN;
Abstract
The invention discloses a low-frequency electromagnetic detection method for large-scale damage of ferromagnetic materials based on broadband excitation. Detection direction of the magnetic field signal of low-frequency electromagnetic sensor is determined according to the size of ferromagnetic member detection defect; the reference signal and detection signal acquisition position are selected, fix the distance between sensor and tested part, excite a Chirp signal as a broadband excitation signal to perform broadband excitation low-frequency electromagnetic detection; the computer processes collected broadband detection signal; use the difference of Euclidean distance between reference signal and defect detection signal as a defect characterization parameter to obtain the Euclidean distance curve of different depth defects on the upper and lower surfaces of ferromagnetic components with the detection position. Through the analysis and processing of the low-frequency electromagnetic broadband detection signal, the Euclidean response signal and reference signal under broadband excitation are used to characterize the change of material damage degree, which can effectively reduce the influence of magnetic field skin effect, and is beneficial to the effective characterization of the upper and lower material surface defects of at different depths.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile