The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Nov. 01, 2021
Beijing University of Technology, Beijing, CN;
Jingpin Jiao, Beijing, CN;
Li Li, Beijing, CN;
Xiang Gao, Beijing, CN;
Quan Cheng, Beijing, CN;
Cunfu He, Beijing, CN;
Bin Wu, Beijing, CN;
BEIJING UNIVERSITY OF TECHNOLOGY, Beijing, CN;
Abstract
The invention discloses a non-linear Lamb wave mixing method for measuring stress distribution in thin metal plates. The method is suitable for stress distribution detection and stress concentration area positioning in a plate structure and belongs to the field of nondestructive detection. The steps of the present invention is: first determines the excitation frequencies of two fundamental waves according to the measured object and the nonlinear Lamb wave mixing resonance conditions; the left and right ends of the test piece are oppositely excited two rows of A0 mode waves, and the excitation signal receive the sum-frequency S0 signal at a certain position to detect non-linear mixing stress of the plate structure; by changing the excitation time delay of the excitation signal, perform mixing scan on different positions of the test piece to extract the mixing wave amplitude; finally, according to the variation of amplitude of sum frequency difference signal with mixing position to realize the detection of stress distribution of metal plate and the positioning of the stress concentration area.