Beijing, China

Jing Ye


Average Co-Inventor Count = 5.7

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2016-2021

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3 patents (USPTO):

Title: Jing Ye - Innovator in Search Result Display and Memory Testing Technologies

Introduction

Jing Ye is a prominent inventor based in Beijing, China. He has made significant contributions to the fields of search result display technologies and memory testing architectures. With a total of 3 patents, his work addresses critical challenges in user interactivity and memory logic testing.

Latest Patents

One of Jing Ye's latest patents is titled "Method, apparatus and system for displaying search results." This invention provides a method for enhancing the display of search results by sending keywords to a server, which retrieves multiple page files containing relevant search results. The innovation improves the interactivity and flexibility of search result presentations, overcoming limitations found in prior art.

Another notable patent is "Test access architecture for stacked memory and logic dies." This invention introduces a test access interface designed for a logic die stacked beneath a memory die. It allows for efficient control of testing logic cores and interconnections, facilitating better testing processes for memory and logic components.

Career Highlights

Jing Ye has worked with notable companies such as Mentor Graphics Corporation and Baidu Online Network Technology (Beijing) Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced technological solutions.

Collaborations

Throughout his career, Jing Ye has collaborated with talented individuals, including Wu-Tung Cheng and Ruifeng Guo. These partnerships have fostered innovation and the exchange of ideas in the tech industry.

Conclusion

Jing Ye's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the fields of search result display and memory testing, paving the way for future advancements.

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