Mentor Graphics Corporation

Baidu Online Network Technology (beijing) Co., Ltd.

Jing Ye

Wu-Tung Cheng

Yu Hu

Yu Jane Huang

Ruifeng Guo

Liyang Lai

Chao Han

Kefeng Li

Martin Keim

Junqi Liu

Ronald Press

Etienne Racine

The present disclosure provides a method, apparatus and system for displaying search results, an apparatus and a computer storage medium. On the one hand, according to embodiments of the present disclosure, the key word is sent to the server so that the server performs a search according to the key word to obtain at least two page files, each of the page files including at least one search result matching the key word, thereby receiving the at least two page files sent by the server; thereby, according to the page style and the special display effect corresponding to each of the page files, rendering each of said page files to display the search result matching the key word. Hence, the technical solutions provided by embodiments of the present disclosure solve the problem in the prior art that the form of displaying the search result page is relatively single and exhibits lower interactivity and flexibility.

Method, apparatus and system for displaying search results, apparatus and computer storage medium

Aspects of the invention relate to test access architecture for stacked memory and logic dies. A test access interface for a logic die that is stacked under a memory die is disclosed. The disclosed test access interface can control testing logic core, interconnections with the memory die and with another logic die. The controlling of testing interconnections with the memory die is through a memory boundary scan register controller in the test access interface.

Test access architecture for stacked memory and logic dies

The disclosed ring-oscillator-based test architecture comprises a plurality of boundary scan cells coupled to a plurality of interconnects and control circuitry. Each of the plurality of boundary scan cells can be configured to operate as, based on control signals, a conventional boundary scan cell or any bit of an asynchronous counter. The control signals are supplied by the control circuitry.

Test architecture for characterizing interconnects in stacked designs

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Beijing, China

Jing Ye