Jin Yi Lee

Title: Innovations of Jin Yi Lee in Nondestructive Testing

Introduction

Jin Yi Lee is a prominent inventor based in Gwangju, South Korea. He has made significant contributions to the field of nondestructive testing, holding a total of five patents. His work focuses on developing advanced devices and methods that enhance the accuracy and efficiency of testing materials without causing damage.

Latest Patents

One of his latest patents is a probe for a nondestructive testing device using crossed gradient induced current. This invention includes an induction coil designed to generate first and second induced currents in crossing directions when powered. Additionally, it features a magnetic sensor part that measures these induced currents. Another notable patent is an eddy current inspection device for nondestructive testing. This device comprises a bobbin-shaped coil that applies induction current to the inner diameter of a specimen, along with a reference coil for comparison. It also includes a manual sensor array and a control module that selects frequencies and generates signals to accurately detect flaws in materials.

Career Highlights

Jin Yi Lee is affiliated with the Industry-Academic Cooperation Foundation at Chosun University. His role in this institution allows him to bridge the gap between academic research and practical applications in the industry. His innovative work has garnered attention and respect within the field of nondestructive testing.

Collaborations

Jin Yi Lee collaborates with notable colleagues, including Jung Min Kim and Jong Woo Jun. Their combined expertise contributes to the advancement of technologies in nondestructive testing.

Conclusion

Jin Yi Lee's contributions to nondestructive testing through his innovative patents demonstrate his commitment to improving testing methods. His work not only enhances the accuracy of inspections but also ensures the integrity of materials in various applications.