The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2021
Filed:
Nov. 25, 2019
Applicant:
Industry-academic Cooperation Foundation, Chosun University, Gwangju, KR;
Inventor:
Jin Yi Lee, Gwangju, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2021.01); H01F 41/04 (2006.01); G01B 7/06 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9046 (2013.01); G01B 7/10 (2013.01); G01N 27/023 (2013.01); H01F 41/04 (2013.01);
Abstract
Disclosed herein are a probe for a nondestructive testing device using a crossed gradient induced current and a method of manufacturing an induction coil for a nondestructive testing device. The probe for a nondestructive testing device using a crossed gradient induced current includes an induction coil formed to have a predetermined width and to generate first and second induced currents in a direction crossing each other when a current is applied from a power supply, and a magnetic sensor part installed adjacent to the induction coil so as to measure the first and second induced currents induced from the induction coil.