The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Nov. 02, 2012
Applicant:

Industry-academic Cooperation Foundation Chosun University, Gwangju, KR;

Inventors:

Jin Yi Lee, Gwangju, KR;

Jong Woo Jun, Gwangju, KR;

Jung Min Kim, Gwangju, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/07 (2006.01); B82Y 25/00 (2011.01); G01N 27/82 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); G01R 33/072 (2013.01); G01R 33/091 (2013.01);
Abstract

Disclosed herein are an apparatus and a method for detecting a crack. The apparatus includes a power supply unit, a sensor module, and a signal reception module. The power supply unit supplies power. The sensor module receives the input power from the power supply unit, and outputs sensing power corresponding to the magnetic field of an object to be measured. The signal reception unit converts the sensing power output from the sensor module into a quantitative value, and computes the distribution of the magnetic field. The sensor module includes a first sensor array configured to detect magnetic field vectors in a direction vertical to a sensor surface, and a second sensor array placed on the first sensor array in an overlapping manner and configured to detect magnetic field vectors in a direction lateral with respect to the sensor surface.


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