The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Oct. 18, 2017
Industry-academic Cooperation Foundation Chosun University, Gwangju, KR;
Jin Yi Lee, Gwangju, KR;
Jung Min Kim, Gwangju, KR;
Myung Chul Jung, Gwangju, KR;
Ji Su Kim, Gwangju, KR;
Abstract
A defect detection device enables easy removal of magnetic impurities. The defect detection device has a structure capable of effectively removing magnetic impurities adhered to a magnetic flux leakage detection device for nondestructive inspection of a small-diameter heat transfer tube or a partially saturated eddy current detection system. With the defect detection device, it is possible to minimize adhesion of magnetic impurities that deteriorate the performance of a leakage magnetic flux detection device for nondestructive inspection of a small-diameter tube of ferromagnetic metal material or a partially saturated eddy current detection system. Further, there is an advantage in that it is possible to remove the adhered magnetic impurities from the defect detection device easily.