Jin-Liang Chen

Title: Jin-Liang Chen: Innovator in Image Calibration and Frequency Identification

Introduction

Jin-Liang Chen is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the fields of image calibration and resonant frequency identification. With a total of 9 patents to his name, Chen's work has advanced the technology used in various applications.

Latest Patents

One of his latest patents is a "Method for Image Calibration and Apparatus for Image Acquiring." This invention relates to a method for calibrating the image formation position of an image acquiring unit based on its relative location to an objective lens. By calculating the focus index of the acquired image, a clear and sharp interferogram can be obtained for three-dimensional surface profile measurement. This method also allows for clear imaging without interference fringes, which is beneficial for two-dimensional defect detection and dimension measurement.

Another notable patent is the "Method and Apparatus for Resonant Frequency Identification through Out-of-Plane Displacement Detection." This invention involves detecting out-of-plane displacement by analyzing fringe density indexes derived from frequency-domain information of interference images. The method enables the identification of resonant frequencies, allowing for the reconstruction of full-field vibratory surface profiles of samples in various resonance modes.

Career Highlights

Jin-Liang Chen has worked with esteemed organizations such as the Industrial Technology Research Institute and National Taipei University of Technology. His experience in these institutions has contributed to his innovative research and development efforts.

Collaborations

Throughout his career, Chen has collaborated with notable colleagues, including Chung-Chu Chang and Liang-Chia Chen. These partnerships have fostered a collaborative environment that enhances the quality and impact of their research.

Conclusion

Jin-Liang Chen's contributions to image calibration and frequency identification demonstrate his commitment to innovation and technology advancement. His patents reflect a deep understanding of complex systems and a drive to improve measurement techniques.