Jiang Wei

Title: Innovations and Contributions of Inventor Jiang Wei

Introduction

Jiang Wei is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of technology, particularly in the area of defect detection and labeling methods. With a total of four patents to his name, Jiang Wei continues to push the boundaries of innovation.

Latest Patents

One of Jiang Wei's latest patents is a method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding. This method involves several steps, including collecting a photographed image of the copper-clad laminate through a line-scan camera, segmenting the copper-clad region, and performing a pyramid operation on the divided original grid image. The process culminates in searching for final defects based on the differences between the background and foreground.

Another significant patent is a machine vision-based sheet labeling method and apparatus. This invention includes a defect inspection process for a target sheet, which generates a defect label carrying defect information represented by a two-dimensional barcode symbol. The labeling occurs at a preset position after the defect inspection, ensuring accurate identification of defects.

Career Highlights

Jiang Wei has worked with prominent companies such as Hangzhou Baizijian Technology Co., Ltd and Harris Membrane Clean Technology Inc. His experience in these organizations has allowed him to refine his skills and contribute to innovative projects.

Collaborations

Throughout his career, Jiang Wei has collaborated with talented individuals, including Ming Ge and Jingxue Shen. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Jiang Wei's contributions to the field of technology through his patents and collaborations highlight his role as an influential inventor. His innovative methods for defect detection and labeling continue to impact the industry positively.