The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jun. 07, 2024
Hangzhou Baizijian Technology Co., Ltd, Hangzhou, CN;
Ming Ge, Hangzhou, CN;
Jingxue Shen, Hangzhou, CN;
Jiang Wei, Hangzhou, CN;
Junwei Xu, Hangzhou, CN;
Hangzhou Baizijian Technology Co., LTD, Hangzhou, CN;
Abstract
A machine vision-based sheet defect labeling method and apparatus, a device and a medium are provided. The method includes: performing a defect inspection on a target sheet conveyed to a preset defect inspection position, specifically, the target sheet continues to be conveyed towards a preset labeling position after passing the preset defect inspection position by being conveyed; generating a defect label of the target sheet when a defect present in the target sheet is determined, specifically, the defect label carries defect information represented by a two-dimensional barcode symbol including discontinuous dots; and labeling the defect of the target sheet at the preset labeling position with the defect label of the target sheet.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile