Hangzhou, China

Jingxue Shen

This inventor holds 2 USPTO granted patents. Top assignee: Hangzhou Baizijian Technology Co., Ltd. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jingxue Shen. Retrieved from https://idiyas.com/inventor/jingxue-shen-uttw78y7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Innovations of Jingxue Shen in Surface Defect Detection

Introduction

Jingxue Shen is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of defect detection in materials, particularly in copper-clad laminates. With a total of 2 patents, his work showcases innovative methods that enhance the quality control processes in manufacturing.

Latest Patents

One of Jingxue Shen's latest patents is titled "Method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding." This method involves several steps, including collecting images of the laminate, segmenting regions, and determining pixel value averages to identify defects. Another significant patent is the "Machine vision-based sheet labeling method and apparatus, device and storage medium." This invention focuses on defect inspection and labeling of target sheets using machine vision technology, ensuring accurate identification and documentation of defects.

Career Highlights

Jingxue Shen is currently employed at Hangzhou Baizijian Technology Co., Ltd. His role involves developing advanced technologies for defect detection, contributing to the company's reputation for innovation in the industry. His expertise in machine vision and defect analysis has positioned him as a key player in his field.

Collaborations

Jingxue collaborates with talented coworkers, including Ming Ge and Jiang Wei. Their combined efforts in research and development have led to advancements in defect detection technologies.

Conclusion

Jingxue Shen's innovative patents and contributions to defect detection technology highlight his importance in the field. His work not only improves manufacturing processes but also sets a standard for quality assurance in materials.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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