This inventor holds 2 USPTO granted patents. Top assignee: Hangzhou Baizijian Technology Co., Ltd. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations of Jingxue Shen in Surface Defect Detection
Introduction
Jingxue Shen is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of defect detection in materials, particularly in copper-clad laminates. With a total of 2 patents, his work showcases innovative methods that enhance the quality control processes in manufacturing.
Latest Patents
One of Jingxue Shen's latest patents is titled "Method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding." This method involves several steps, including collecting images of the laminate, segmenting regions, and determining pixel value averages to identify defects. Another significant patent is the "Machine vision-based sheet labeling method and apparatus, device and storage medium." This invention focuses on defect inspection and labeling of target sheets using machine vision technology, ensuring accurate identification and documentation of defects.
Career Highlights
Jingxue Shen is currently employed at Hangzhou Baizijian Technology Co., Ltd. His role involves developing advanced technologies for defect detection, contributing to the company's reputation for innovation in the industry. His expertise in machine vision and defect analysis has positioned him as a key player in his field.
Collaborations
Jingxue collaborates with talented coworkers, including Ming Ge and Jiang Wei. Their combined efforts in research and development have led to advancements in defect detection technologies.
Conclusion
Jingxue Shen's innovative patents and contributions to defect detection technology highlight his importance in the field. His work not only improves manufacturing processes but also sets a standard for quality assurance in materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile