The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jul. 05, 2024
Applicant:

Hangzhou Baizijian Technology Co., Ltd, Zhejiang, CN;

Inventors:

Ming Ge, Hangzhou, CN;

Jiang Wei, Hangzhou, CN;

Jingxue Shen, Hangzhou, CN;

Luye Ma, Hangzhou, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/02 (2024.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 3/02 (2024.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30141 (2013.01);
Abstract

Provided is a method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding. The method includes: S1, collecting a photographed image of the copper-clad laminate through a line-scan camera; S2, segmenting out a copper-clad region and a non-copper-clad region, and rotating the copper-clad region upright; S3, dividing the copper-clad region of the image of the copper-clad laminate, and performing a pyramid operation on a divided original grid image; S4, determining averages of pixel values at all levels; S5, fusing the average at all levels to obtain a final background average; and S6, searching for a final defect according to a difference between a background and a foreground.


Find Patent Forward Citations

Ge, Ming. (2025). Method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding (U.S. Patent No. 12430750). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12430750

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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