Ming Ge

Title: Innovations by Ming Ge in Surface Defect Detection

Introduction

Ming Ge is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of defect detection in materials, particularly through his innovative methods and technologies. With a total of 2 patents, his work is recognized for its practical applications in industry.

Latest Patents

Ming Ge's latest patents include a method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding. This method involves several steps, including collecting images through a line-scan camera, segmenting regions, and determining averages of pixel values to identify defects. Another patent focuses on a machine vision-based sheet labeling method and apparatus. This technology inspects target sheets for defects and generates defect labels that carry information represented by a two-dimensional barcode symbol.

Career Highlights

Ming Ge is currently employed at Hangzhou Baizijian Technology Co., Ltd. His work at this company emphasizes the importance of innovation in quality control processes. His contributions have enhanced the efficiency and accuracy of defect detection in various applications.

Collaborations

Ming Ge collaborates with talented coworkers, including Jingxue Shen and Jiang Wei. Their combined expertise fosters a creative environment that drives technological advancements in their field.

Conclusion

Ming Ge's innovative approaches to defect detection demonstrate his commitment to advancing technology in material inspection. His patents reflect a deep understanding of machine vision and its applications in industry.