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For the Inventor, By the Inventor

Los Altos, CA, United States of America

Jean-Luc Truche

This inventor holds 23 USPTO granted patents and 4 EPO patents, primarily in Mass Spectrometry. Top assignees: Agilent Technologies, Inc., Hewlett-Packard Company, Other. Active years: 1987-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Luc Truche. Retrieved from https://idiyas.com/inventor/jean-luc-truche

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23

% Patents Active = 78.3

 

Average Co-Inventor Count = 2.5

ph-index = 6

Forward Citations = 181(Granted Patents)


Location History:

  • Loveland, CO (US) (2008)
  • Los Altos, CA (US) (1987 - 2012)

Company Filing History:

goldMedal21 out of 4,730 
 
Agilent Technologies, Inc.
 patents
silverMedal1 out of 9,639 
 
Hewlett-Packard Company
 patents
bronzeMedal1 out of 834,453 
Other
 patents

Years Active: 1987-2012

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Areas of Expertise:
Mass Spectrometry
Ion Production
MALDI Imaging
Micro Matrix Ion Generator
Laser Focusing
Surface Desorption Ionization
Sample Plate
Flight Tube Calibration
Target Support
GC/MS Interface
Depth of Field
Ion Source Illumination
23 patents (USPTO):Explore Patents
1. 8129677 - Method and apparatus for surface desorption ionization by charged particles (2012-03-06),
2. 7855357 - Apparatus and method for ion calibrant introduction (2010-12-21),
3. 7723678 - Method and apparatus for surface desorption ionization by charged particles (2010-05-25),
4. 7495231 - MALDI sample plate imaging workstation (2009-02-24),
5. 7435951 - Ion source sample plate illumination system (2008-10-14),
6. 7423261 - Curved conduit ion sampling device and method (2008-09-09),
7. 7423260 - Apparatus for combined laser focusing and spot imaging for MALDI (2008-09-09),
8. 7372043 - Apparatus and method for ion production enhancement (2008-05-13),
9. 7365310 - Increased depth of field for high resolution imaging for a matrix-based ion source (2008-04-29),
10. 7262841 - Laser alignment for ion source (2007-08-28),
11. 7205536 - Micro matrix ion generator for analyzers (2007-04-17),
12. 7183543 - Compensating for a measured variation in length of a flight tube of a mass spectrometer (2007-02-27),
13. 7135689 - Apparatus and method for ion production enhancement (2006-11-14),
14. 7132670 - Apparatus and method for ion production enhancement (2006-11-07),
15. 7115860 - Micro matrix ion generator for analyzers (2006-10-03),

Title: Innovations and Contributions of Jean-Luc Truche

Introduction

Jean-Luc Truche, based in Los Altos, California, is a notable inventor with an impressive portfolio of 23 patents. His groundbreaking work primarily focuses on ion generation technologies, contributing significantly to advancements in mass spectrometry and related fields.

Latest Patents

Among his latest innovations is the "Method and Apparatus for Surface Desorption Ionization by Charged Particles." This invention presents an apparatus that generates analyte ions from a sample through physical interaction between high-velocity gas and specific materials. Another noteworthy patent is the "Apparatus and Method for Ion Calibrant Introduction," which facilitates the introduction of calibrant ions into various systems, enhancing the precision and reliability of mass spectrometry applications.

Career Highlights

Jean-Luc Truche’s career includes significant roles in prominent companies such as Agilent Technologies, Inc. and Hewlett-Packard Company. His contributions in these organizations have led to substantial advancements in ion-related technologies, establishing him as a leading figure in his field.

Collaborations

Throughout his career, Truche has collaborated with esteemed colleagues, including Paul C. Goodley and Jian Bai. These partnerships have further propelled innovations and the development of cutting-edge technologies in their respective fields.

Conclusion

With 23 patents to his name, Jean-Luc Truche continues to innovate and inspire within the realm of ion generation and mass spectrometry. His work not only enhances scientific understanding but also contributes to practical applications that benefit various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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