The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Jun. 08, 2005
Jean-luc Truche, Loveland, CO (US);
Gregor T. Overney, Loveland, CO (US);
William D. Fisher, Loveland, CO (US);
Richard P. Tella, Loveland, CO (US);
Jean-Luc Truche, Loveland, CO (US);
Gregor T. Overney, Loveland, CO (US);
William D. Fisher, Loveland, CO (US);
Richard P. Tella, Loveland, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also contain an imaging device, e.g., a CCD or CMOS camera or the like, for viewing the area. In one embodiment, the imaging device may be connected to a display, e.g., a video monitor. Methods and mass spectrometry systems empliying the ion source are also provided.