The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Apr. 05, 2006
Jean-luc Truche, Los Altos, CA (US);
Paul C. Goodley, Cupertino, CA (US);
Steven M. Fischer, Hayward, CA (US);
Jian Bal, Sunnyvale, CA (US);
Jean-Luc Truche, Los Altos, CA (US);
Paul C. Goodley, Cupertino, CA (US);
Steven M. Fischer, Hayward, CA (US);
Jian Bal, Sunnyvale, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.