This inventor holds 3 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 2008-2014.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Jayesh C Raval. Retrieved from https://idiyas.com/inventor/jayesh-c-raval
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Calculating rank
% Patents Active = 100.0
Average Co-Inventor Count = 4.0
ph-index = 2
Forward Citations = 14(Granted Patents)
Location History:
- Richardson, TX (US) (2008)
- Allen, TX (US) (2013 - 2014)
Company Filing History:
Years Active: 2008-2014
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3 patents (USPTO):Explore Patents
1. 8693271 - Method of stressing static random access memories for pass transistor defects (2014-04-08),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Jayesh C Raval. Retrieved from https://idiyas.com/inventor/jayesh-c-raval
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]