This inventor holds 5 USPTO granted patents and 1 EPO patent. Top assignees: Bionavis Ltd., Beanor Oy, Bionavis Oy. Active years: 2006-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2006-2019
Title: Janusz Sadowski: Innovator in Surface Phenomena Monitoring
Introduction
Janusz Sadowski is a notable inventor based in Tampere, Finland. He has made significant contributions to the field of surface phenomena monitoring, holding a total of 5 patents. His work focuses on advanced methods and devices that enhance the understanding and measurement of surface interactions.
Latest Patents
Sadowski's latest patents include a "Method and apparatus for monitoring surface phenomena" and a "Method and device for carrying out surface plasmon resonance measurement." The first patent outlines a method for monitoring surface phenomena, which involves directing a beam of electromagnetic radiation through a prism onto a material layer. This setup creates a resonance phenomenon, allowing for the measurement of changes in the intensity of the reflected electromagnetic radiation. The second patent details a similar approach, emphasizing the use of a detector to capture the intensity changes caused by surface resonance.
Career Highlights
Throughout his career, Janusz Sadowski has worked with various companies, including Bionavis Ltd. and Beanor Oy. His experience in these organizations has contributed to his expertise in the field of surface phenomena and measurement technologies.
Collaborations
Sadowski has collaborated with notable individuals such as Inger Vikholm and Niko Granqvist. These partnerships have likely enriched his research and development efforts in the field.
Conclusion
Janusz Sadowski's innovative work in surface phenomena monitoring and his contributions to the field through his patents highlight his role as a significant inventor. His advancements continue to influence the understanding of surface interactions and measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile