The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7701582 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 20, 2010

Filed:

Nov. 19, 2003
Applicant:

Janusz Sadowski, Tampere, FI;

Inventor:

Janusz Sadowski, Tampere, FI;

Assignee:

Beanor Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a device for carrying out surface plasmon resonance measurement. A beam of electromagnetic radiation is produced by a source of electromagnetic radiation. The beam of electromagnetic radiation is directed through a prism onto a material layer in an angle of incidence, which material layer covers a planar surface of the prism. A resonance phenomenon is caused. A beam of reflected electromagnetic radiation is produced and directed by the surface to a detector for detecting the level of intensity of the beam of reflected electromagnetic radiation. The change of intensity of the beam of reflected electromagnetic radiation, caused by the surface resonance phenomenon, is measured. The beam of reflected electromagnetic radiation is reflected with a mirror to the detector.


Find Patent Forward Citations

Sadowski, Janusz. (2010). Method and device for carrying out surface plasmon resonance measurement (U.S. Patent No. 7701582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7701582

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