The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Feb. 18, 2015
Applicant:
Bionavis Oy, Ylöjärvi, FI;
Inventors:
Janusz Sadowski, Tampere, FI;
Niko Granqvist, Ylöjärvi, FI;
Jussi Tuppurainen, Julkujärvi, FI;
Annika Jokinen, Helsinki, FI;
Assignee:
BioNavis Oy, Ylojarvi, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01); G01N 21/77 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G01N 21/77 (2013.01); G01N 33/54373 (2013.01); G01N 2021/7773 (2013.01); G01N 2201/126 (2013.01);
Abstract
A method for monitoring surface phenomena includes
Sadowski, Janusz. (2019). Method and apparatus for monitoring surface phenomena (U.S. Patent No. 10495571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10495571
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile