James R Jordan

Title: Innovations by James R. Jordan

Introduction

James R. Jordan is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of semiconductor integrated circuit testing.

Latest Patents

One of his latest patents is titled "Interface structure for semiconductor integrated circuit test equipment." This invention provides an innovative interface structure that connects a test head interface to a device under test (DUT) interface. It includes a first frame member with opposite main faces, a second frame member, and a spacer that secures both frame members together. The design incorporates cable assembly headers that ensure electrical insulation and connectivity between the components.

Another significant patent is "Apparatus for testing semiconductor integrated circuit devices in wafer form." This apparatus features a test head and a probe card support mechanism that allows for efficient testing of semiconductor devices. The design includes a wafer prober that presents successive wafers to the test head, along with a lifting mechanism that elevates the test head for optimal testing conditions.

Career Highlights

James R. Jordan is currently employed at Credence Systems Corporation, where he continues to innovate in the semiconductor testing domain. His expertise and inventions have contributed to advancements in the industry, making testing processes more reliable and efficient.

Collaborations

Throughout his career, James has collaborated with notable colleagues, including James M. Hannan and John J. Harsany. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

James R. Jordan's contributions to semiconductor technology through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence the efficiency of semiconductor testing, showcasing the importance of innovation in technology.