San Jose, CA, United States of America

James E Nulty


Average Co-Inventor Count = 2.2

ph-index = 9

Forward Citations = 559(Granted Patents)


Company Filing History:


Years Active: 1990-2010

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18 patents (USPTO):Explore Patents

Title: The Innovative Contributions of James E. Nulty

Introduction

James E. Nulty is a prominent inventor based in San Jose, California. He holds a total of 18 patents, showcasing his significant contributions to the field of technology and engineering. His work primarily focuses on advancements in probe card technology, which is essential for testing semiconductor devices.

Latest Patents

Among his latest patents, Nulty has developed a method of fabricating a probe card. This innovative probe card is designed for testing dice on a wafer and includes a substrate with several cantilevers formed on its surface. The probes extend from the unsupported ends of these cantilevers, projecting over cavities on the substrate's surface. The tips of the probes are engineered to contact pads on the dice under test. Additionally, the probe card may feature a compressive layer above the substrate, with holes through which the probes extend. Another notable patent is for a probe card and method for constructing the same, which shares similar features and functionalities.

Career Highlights

Throughout his career, James E. Nulty has worked with notable companies such as Cypress Semiconductor Corporation and VLSI Technology, Inc. His experience in these organizations has allowed him to refine his skills and contribute to significant technological advancements.

Collaborations

Nulty has collaborated with talented individuals in the industry, including Usha Raghuram and Bo Jin. These partnerships have further enhanced his innovative capabilities and have led to the development of groundbreaking technologies.

Conclusion

James E. Nulty's contributions to the field of semiconductor testing through his innovative probe card technologies have made a lasting impact. His extensive patent portfolio reflects his dedication to advancing technology and improving testing methodologies.

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