The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2005

Filed:

May. 13, 2002
Applicants:

James E. Nulty, San Jose, CA (US);

Brenor L. Brophy, San Jose, CA (US);

Thomas A. Mccleary, Los Gatos, CA (US);

BO Jin, Campbell, CA (US);

Qi Gu, Fremont, CA (US);

Thurman J. Rodgers, Woodside, CA (US);

John O. Torode, Hunts Point, WA (US);

Inventors:

James E. Nulty, San Jose, CA (US);

Brenor L. Brophy, San Jose, CA (US);

Thomas A. McCleary, Los Gatos, CA (US);

Bo Jin, Campbell, CA (US);

Qi Gu, Fremont, CA (US);

Thurman J. Rodgers, Woodside, CA (US);

John O. Torode, Hunts Point, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3102 ; G01R 3126 ;
U.S. Cl.
CPC ...
Abstract

In one embodiment, an environment for testing integrated circuits includes a first die coupled to a tester. The first die includes a removable connection configured to couple a signal from the first die with an adapter layer to a second die being tested. The removable connection may be an elastomeric interposer or a probe, for example.


Find Patent Forward Citations

Loading…