James Broc Stirton

This inventor holds 44 USPTO granted patents, primarily in Semiconductor Metrology. Top assignees: Advanced Micro Devices Corporation, Globalfoundries Inc.. Active years: 2002-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Broc Stirton. Retrieved from https://idiyas.com/inventor/james-broc-stirton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 44

% Patents Active = 70.5

Average Co-Inventor Count = 1.8

ph-index = 11

Forward Citations = 540(Granted Patents)

Location History:

Dresden, DE (2010 - 2011)
Austin, TX (US) (2002 - 2012)
Galway, NY (US) (2019)

Company Filing History:

39 out of 13,161

Advanced Micro Devices Corporation

Years Active: 2002-2019

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Areas of Expertise:

Error Detection

Fabrication Processes

Scatterometry Techniques

Process Control

Metrology Data

Photolithography

Stepper Parameters

Electromigration Analysis

Adaptive Sampling

Polishing Process

Critical Dimension Measurements

Device Structures

44 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10289109 - Methods of error detection in fabrication processes (2019-05-14),

2. 10241502 - Methods of error detection in fabrication processes (2019-03-26),

3. 8149384 - Method and apparatus for extracting dose and focus from critical dimension data (2012-04-03),

4. 7925369 - Method and apparatus for optimizing models for extracting dose and focus from critical dimension (2011-04-12),

5. 7869894 - Method and system for advanced process control using a combination of weighted relative bias values (2011-01-11),

6. 7840298 - Method and system for advanced process control using measurement uncertainty as control input (2010-11-23),

7. 7831324 - Method and system for randomizing wafers in a complex process line (2010-11-09),

8. 7738986 - Method and apparatus for compensating metrology data for site bias prior to filtering (2010-06-15),

9. 7565254 - Method and apparatus for metrology sampling using combination sampling rules (2009-07-21),

10. 7330800 - Method and apparatus for selecting sites for sampling (2008-02-12),

11. 6989900 - Method of measuring implant profiles using scatterometric techniques (2006-01-24),

12. 6980300 - Method and apparatus for generating a polishing process endpoint signal using scatterometry (2005-12-27),

13. 6972853 - Methods of calibrating and controlling stepper exposure processes and tools, and system for accomplishing same (2005-12-06),

14. 6968252 - Method and apparatus for dispatching based on metrology tool performance (2005-11-22),

15. 6933158 - Method of monitoring anneal processes using scatterometry, and system for performing same (2005-08-23),

Title: James Broc Stirton - Innovative Inventor from Austin, TX

Introduction: James Broc Stirton is a talented inventor based in Austin, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: James Broc Stirton holds several patents in the fields of technology, healthcare, and consumer products, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, James Broc Stirton has consistently demonstrated his ability to transform innovative ideas into tangible inventions that have made a significant impact in the market.

Collaborations: Throughout his career, James Broc Stirton has collaborated with leading companies, research institutions, and universities to further develop and commercialize his inventions, solidifying his reputation as a sought-after inventor in the industry.

Conclusion: James Broc Stirton's passion for innovation and his relentless drive to push the boundaries of what is possible make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]