The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Dec. 13, 2006
Richard P. Good, Austin, TX (US);
James Broc Stirton, Austin, TX (US);
Richard P. Good, Austin, TX (US);
James Broc Stirton, Austin, TX (US);
Advanced Micro Devices, Inc., Austin, TX (US);
Abstract
A method includes defining a plurality of simple sampling rules for selecting material for metrology. Each simple sampling rule has an associated penalty. At least one combination sampling rule relating a subset of at least two simple sampling rules is defined. The combination sampling rule has an associated penalty. The penalties are assessed responsive to a previous material selection not satisfying the simple sampling rules or the combination sampling rule. Material is selected for subsequent metrology based on the sampling rules and the assessed penalties. At least one characteristic of the selected material is measured.