The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
May. 08, 2006
Applicants:
Hans-juergen Malig, Dresden, DE;
James Broc Stirton, Dresden, DE;
Inventors:
Hans-Juergen Malig, Dresden, DE;
James Broc Stirton, Dresden, DE;
Assignee:
Advanced Micro Devices, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
By taking into consideration the measurement uncertainties in the form of standard errors, the performance of APC controllers may be efficiently enhanced by using the standard errors as a control input. For example, the filter parameter of an EWMA filter may be efficiently scaled on the basis of a standard error of measurement data.
Malig, Hans-Juergen. (2010). Method and system for advanced process control using measurement uncertainty as control input (U.S. Patent No. 7840298). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7840298
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile