This inventor holds 20 USPTO granted patents and 1 published patent application. Top assignees: Nanometrics Inc., The United States of America as Represented by the United States, Other. Active years: 1982-2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Portola Valley, CA (US) (1982 - 1983)
- Capitola, CA (US) (1993)
- Los Gatos, CA (US) (1994 - 2004)
- Boulder Creek, CA (US) (2003 - 2014)
Company Filing History:
15 out of 153 
1 out of 3,975 
4 out of 834,453 Years Active: 1982-2014
Title: Innovations by Jaime Poris: A Pioneer in Metrology
Introduction
Jaime Poris, a prolific inventor based in Boulder Creek, California, has made significant contributions to the field of metrology, holding a remarkable 20 patents. His innovative designs and systems have advanced measurement techniques and improved precision in various applications, showcasing his expertise and commitment to excellence in technology.
Latest Patents
Among his latest innovations, Poris has developed an "Automated System Check for Metrology Unit." This invention features an integrated reference target that allows for an automated system check process, measuring a feature on the reference target to ensure it complies with desired specifications. When discrepancies arise, an automated diagnosis process is employed, optimizing both checks and diagnoses through correlations between key parameters.
Another noteworthy patent is the "Eddy Current Sensor with Concentric Confocal Distance Sensor." This metrology instrument enhances measurement accuracy by combining an eddy current sensor with a confocal distance sensor. The confocal setup allows for precise vertical placement without needing to adjust lateral positions, which minimizes errors and increases throughput by decreasing the stage travel required for a single measurement.
Career Highlights
Jaime Poris has had a successful career, with significant experience at companies such as Nanometrics Inc. His work has consistently focused on enhancing metrology instruments, making a lasting impact in the industry through his innovative designs and patents.
Collaborations
Throughout his career, Poris has collaborated with notable professionals, including Claudio L Rampoldi and Pablo I Rovira. Together, they have worked on various projects that aimed to push the boundaries of measurement technology and improve overall precision in metrology.
Conclusion
Jaime Poris’s contributions to metrology through his 20 patents have established him as a key figure in the field. His innovative approaches to automated system checks and sensor technology have greatly enhanced measurement accuracy and efficiency. As he continues to develop groundbreaking solutions, Poris remains a valuable asset to the world of inventions and innovations in metrology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile