Jae-Sun Cho

Title: Innovator Spotlight: Jae-Sun Cho

Introduction: Jae-Sun Cho is a notable inventor based in Gyeonggi-do, South Korea, known for his significant contributions to the field of semiconductor technology. With two patents to his name, Cho has focused his research on advancements in defect classification and wafer pattern inspection, which are crucial for enhancing the quality of semiconductor manufacturing processes.

Latest Patents: Jae-Sun Cho's latest patents demonstrate his innovative approach towards improving substrate and wafer inspection methodologies. His first patent, titled "Method and apparatus for classifying repetitive defects on a substrate," introduces a technique where defects on dies are compared with a predetermined reference die. This involves marking sets of coordinates on the reference die corresponding to the defects, allowing for effective classification of repetitive defects that occur in specified regions.

The second patent, "Apparatus and method for inspecting patterns on wafers," encompasses a comprehensive wafer pattern inspecting system. This apparatus utilizes an image sensor to capture data from both a reference die and a sample die. It includes various components such as an external memory for data storage, an encoder and decoder for data compression, and an arithmetic module for processing the image data to extract reference images. Ultimately, this invention enables the comparison of sample die images against reference data to identify defects effectively.

Career Highlights: As an inventor at Samsung Electronics Co., Ltd., Jae-Sun Cho has dedicated his career to enhancing semiconductor production processes. His patents reflect a deep understanding of the challenges faced in the industry and showcase his commitment to innovation. Collaborating with his skilled coworkers, Byung-Am Lee and Byung-Seol Ahn, Cho has made strides in tackling complex defect analysis, which is crucial for maintaining high quality in semiconductor devices.

Collaborations: Jae-Sun Cho’s collaborative efforts with colleagues such as Byung-Am Lee and Byung-Seol Ahn have fostered a team-oriented environment that encourages innovation. Their combined expertise has contributed to the development of advanced inspection technology in the semiconductor field, thereby enhancing the manufacturing precision and reliability of electronic components.

Conclusion: Jae-Sun Cho’s contributions to the field of semiconductor technology through his patents serve not only as a testament to his ingenuity but also to the continuous pursuit of excellence in manufacturing processes at Samsung Electronics Co., Ltd. His work is crucial in ensuring the reliability and quality of semiconductor devices, marking him as a significant innovator in the industry.