Carmel, IN, United States of America

Jae Hong Choi


Average Co-Inventor Count = 1.9

ph-index = 4

Forward Citations = 34(Granted Patents)


Location History:

  • Carmel, IN (US) (1991 - 2002)
  • Westminister, CO (US) (2009)
  • Westminster, CO (US) (2010 - 2013)

Company Filing History:


Years Active: 1991-2013

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9 patents (USPTO):Explore Patents

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Title: Innovator Spotlight: Jae Hong Choi - Revolutionizing Thermal Imaging and Quality Testing

Introduction: Inventor Jae Hong Choi, based in Carmel, IN (US), is a prolific innovator with a keen focus on advancing thermal conductivity detection and image enhancement technologies. With an impressive portfolio of 9 patents, Choi's groundbreaking work is reshaping the landscape of quality testing in the electronics industry.

Latest Patents:

1. Non-destructive thermal conductivity detection of solder voids: Choi's system and methods enable the production of thermal images of thermally-enhanced integrated circuits mounted upon circuit boards. By leveraging a thermal imaging camera, heat conduction and dissipation through the heat sink into the mounting pad can be visualized. This innovation plays a crucial role in identifying voids or failures in IC mounting, enhancing overall product reliability.

2. Method to enhance X-ray and optical images and locate nano-scale cracks in electric devices and components: Choi's image enhancer technology offers a solution for improving quality testing outcomes by infiltrating cracks and defects in materials. By increasing contrast in images obtained from X-ray devices, nano-scale cracks in electric components can be accurately located and analyzed, ensuring optimal product performance.

Career Highlights: With a notable professional trajectory, Choi has contributed his expertise to renowned organizations such as Avaya Inc. and Avaya Technology LLC. His innovative concepts and technological advancements have significantly impacted the field of electronics manufacturing and quality assurance.

Collaborations: Throughout his career, Choi has collaborated closely with industry experts such as Mark Dee Woolley and James Erin Evans. Together, they have spearheaded projects that have paved the way for cutting-edge advancements in thermal imaging and quality testing methodologies.

Conclusion: Jae Hong Choi's relentless pursuit of innovation and commitment to excellence have established him as a trailblazer in the realm of thermal conductivity detection and quality testing. His remarkable patents and industry collaborations underscore his significant contributions to the field, setting new standards for precision and reliability in electronic device manufacturing.

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