The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Apr. 18, 2007
Applicants:
Jae H. Choi, Westminster, CO (US);
James E. Evans, Brighton, CO (US);
Matthew Gilhousen, Westminster, CO (US);
Mark D. Woolley, Broomfield, CO (US);
Inventors:
Jae H. Choi, Westminster, CO (US);
James E. Evans, Brighton, CO (US);
Matthew Gilhousen, Westminster, CO (US);
Mark D. Woolley, Broomfield, CO (US);
Assignee:
Avaya Inc., Basking Ridge, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides an image enhancer that can be applied to various materials during quality testing. The image enhancer is adapted to infiltrate cracks, crevices, fractures, fissures, and other faults, defects, or flaws in the material and provide an increased contrast for images taken by, for example, an X-ray imaging device.