Westminster, CO, United States of America

Matthew Gilhousen

This inventor holds 1 USPTO granted patent. Top assignee: Avaya Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Gilhousen. Retrieved from https://idiyas.com/inventor/matthew-gilhousen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Matthew Gilhousen

Introduction

Matthew Gilhousen is an accomplished inventor based in Westminster, CO (US). He has made significant contributions to the field of imaging technology, particularly in enhancing the quality of X-ray and optical images. His work focuses on identifying and locating nano-scale cracks in electronic devices and components, which is crucial for quality assurance in manufacturing.

Latest Patents

Matthew holds a patent for a "Method to enhance X-ray and optical images and locate nano-scale cracks in electric devices and components." This invention provides an image enhancer that can be applied to various materials during quality testing. The image enhancer is designed to infiltrate cracks, crevices, fractures, fissures, and other faults in the material, thereby providing increased contrast for images taken by X-ray imaging devices. He has 1 patent to his name.

Career Highlights

Matthew is currently employed at Avaya Inc., where he continues to innovate and develop new technologies. His work has been instrumental in improving the reliability and safety of electronic devices through advanced imaging techniques.

Collaborations

Some of his notable coworkers include Jae Hong Choi and James Erin Evans, who have collaborated with him on various projects within the company.

Conclusion

Matthew Gilhousen's contributions to imaging technology and quality assurance in electronic devices highlight his innovative spirit and dedication to advancing the field. His patent serves as a testament to his expertise and commitment to enhancing the reliability of modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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