This inventor holds 4 USPTO granted patents. Top assignees: Kla Tencor Corporation, Novellus Systems Incorporated. Active years: 2001-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001-2013
Title: Innovations of J Kirkwood H Rough
Introduction
J Kirkwood H Rough is a notable inventor based in San Jose, California. He has made significant contributions to the field of photovoltaics, holding a total of four patents. His work focuses on improving the efficiency and reliability of photovoltaic materials through innovative inspection methods.
Latest Patents
One of his latest patents is titled "Inline inspection of photovoltaics for electrical defects." This patent describes a method for inline inspection of photovoltaic material to identify electrical anomalies. The process involves forming a first electrical connection to one surface of the photovoltaic material and a second electrical connection to the opposing surface. A localized current is induced in the material, and the properties of this current are sensed using the established electrical connections. The analysis of these properties allows for the detection of electrical anomalies within the photovoltaic material.
Career Highlights
Throughout his career, J Kirkwood H Rough has worked with prominent companies in the technology sector. He has been associated with Kla-Tencor Corporation and Novellus Systems Incorporated, where he contributed to advancements in semiconductor and photovoltaic technologies.
Collaborations
Some of his notable coworkers include George H Zapalac, Jr. and Kirk Joseph Bertsche. Their collaborative efforts have furthered the development of innovative solutions in the field of photovoltaics.
Conclusion
J Kirkwood H Rough's contributions to the field of photovoltaics through his patents and collaborations highlight his role as a significant inventor. His innovative methods for inspecting photovoltaic materials continue to impact the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

