The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Mar. 24, 2007
George H. Zapalac, Jr., Santa Cruz, CA (US);
Kirk J. Bertsche, San Jose, CA (US);
David L. Brown, Sunnyvale, CA (US);
J. Kirkwood H. Rough, San Jose, CA (US);
David A. Soltz, San Jose, CA (US);
Yehiel Gotkis, Fremont, CA (US);
George H. Zapalac, Jr., Santa Cruz, CA (US);
Kirk J. Bertsche, San Jose, CA (US);
David L. Brown, Sunnyvale, CA (US);
J. Kirkwood H. Rough, San Jose, CA (US);
David A. Soltz, San Jose, CA (US);
Yehiel Gotkis, Fremont, CA (US);
KLA-Tencor Corporation, Milpitas, CA (US);
Abstract
A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.