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Isao Yonekura

USPTO Granted Patents = 4 (Patent Applications = 3)

Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 12(Granted Patents)

Location History:

Kuki, JP (2014)
Tokyo, JP (2013 - 2016)

Company Filing History:

Toppan Printing Co., Ltd.

Adv Antest Corporation

where one patent can have more than one assignee

Years Active: 2013-2016

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4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9236218 - Defect inspection apparatus and method using a plurality of detectors to generate a subtracted image that may be used to form a subtraction profile (2016-01-12),

2. 8779359 - Defect review apparatus and defect review method (2014-07-15),

3. 8754935 - Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection program (2014-06-17),

4. 8604431 - Pattern-height measuring apparatus and pattern-height measuring method (2013-12-10),

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