This inventor holds 4 USPTO granted patents and 3 published patent applications. Top assignees: Toppan Printing Co., Ltd., Adv Antest Corporation. Active years: 2013-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Kuki, JP (2014)
- Tokyo, JP (2013 - 2016)
Company Filing History:
4 out of 1,269 
2 out of 2,282 
Years Active: 2013-2016
Title: Isao Yonekura: Innovator in Defect Inspection Technology
Introduction
Isao Yonekura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of defect inspection technology, holding a total of 4 patents. His work focuses on enhancing the accuracy and efficiency of defect detection in various materials.
Latest Patents
Yonekura's latest patents include a defect inspection apparatus and method that utilizes multiple detectors to generate a subtracted image for forming a subtraction profile. This innovative apparatus features an electron scanning unit that scans the surface of a sample with an electron beam. It is equipped with several detectors arranged around the optical axis of the electron beam, which detect electrons emitted from the sample's surface. The signal processing unit generates image data based on the detection signals, while the analysis unit identifies defects caused by surface irregularities. Additionally, a control unit adjusts the scanning speed of the electron beam according to the sample type.
Another notable patent is the defect review apparatus and method, which includes an electron scanning part that irradiates and scans an electron beam over a sample's observation region. This apparatus employs four electron detectors positioned at 90° intervals around the optical axis. The signal processing unit generates multiple pieces of image data from different directions, allowing for effective defect detection, especially in line-and-space patterns.
Career Highlights
Throughout his career, Isao Yonekura has worked with notable companies such as Toppan Printing Co., Ltd. and Adv Antest Corporation. His experience in these organizations has contributed to his expertise in defect inspection technologies.
Collaborations
Yonekura has collaborated with several professionals in his field, including Tsutomu Murakawa and Hidemitsu Hakii. These collaborations have further enriched his work and innovations.
Conclusion
Isao Yonekura's contributions to defect inspection technology have made a significant impact in the industry. His innovative patents and collaborations reflect his dedication to advancing this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile