Location History:
- Hachioji, JP (1989)
- Otsuki, JP (1994 - 2004)
Company Filing History:
Years Active: 1989-2004
Title: Isao Ochiai: Innovator in Electron Microscopy
Introduction
Isao Ochiai is a prominent inventor based in Otsuki, Japan. He has made significant contributions to the field of electron microscopy, holding a total of 7 patents. His work focuses on enhancing the capabilities of electron microscopes, particularly in the area of X-ray analysis.
Latest Patents
Ochiai's latest patents include an innovative electron microscope that incorporates an apparatus for X-ray analysis. This advanced electron microscope is capable of performing elemental analysis using X-rays emitted from a specimen through electron beam irradiation. It allows for the inspection of foreign particles, enhancing manufacturing yields at high speed, precision, and spatial resolution. The electron beam's current quantity is automatically controlled to maintain an X-ray count rate between 1000 to 2000 counts per second. A plurality of X-ray energy regions is established for checking an X-ray spectrum against reference spectra stored in a database. Matching is performed for each energy region, and the distribution of observed elements is analyzed based on the intensity ratio of X-ray sample spectra obtained at varied acceleration voltages.
Another notable patent involves a high-sensitivity X-ray detector. This detector minimizes image distortion caused by astigmatism when approaching a specimen on the electron microscope stage. When charged particles strike a specimen, they emit backscattered charged particles along with X-rays. To prevent these undesired charged particles from entering the X-ray detecting element, a first magnetic field is generated, complemented by a second magnetic field to cancel any leakage at the specimen's position.
Career Highlights
Throughout his career, Isao Ochiai has worked with notable companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these organizations has significantly influenced his innovative work in electron microscopy.
Collaborations
Ochiai has collaborated with esteemed colleagues, including Kimio Kanda and Seiichi Murayama. Their joint efforts have contributed to advancements in the field of electron microscopy.
Conclusion
Isao Ochiai's contributions to electron microscopy through his patents and collaborations have established him as a key figure in the field. His innovative approaches continue to enhance the capabilities of electron microscopes, paving the way for future advancements.