Company Filing History:
Years Active: 2015
Title: Igor Varvaruk: Innovator in Measurement Data Analysis
Introduction
Igor Varvaruk is a notable inventor based in Migdal Haemek, Israel. He has made significant contributions to the field of measurement data analysis, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
One of Igor's latest patents is titled "Analyses of Measurement Data." This method involves generating information that displays variations of a parameter across a photo mask relative to an average value of the parameter measured at various locations on the photo mask. The information can include data points, each determined based on a ratio between a measurement value and an average of multiple measurement values. Another significant patent is "Critical Dimension Uniformity Correction by Scanner Signature Control." This invention determines the contribution to a wafer level critical dimension distribution from a scanner of a lithography system, based on measured wafer level critical dimension uniformity distribution and contributions from a photo mask. It includes measuring light transmission across the photo mask and determining the transmittance variation distribution.
Career Highlights
Igor Varvaruk is currently employed at Carl Zeiss SMS Ltd., where he applies his expertise in measurement data analysis. His work has been instrumental in advancing technologies related to lithography systems and photo masks.
Collaborations
Igor collaborates with talented individuals such as Vladimir Dmitriev and Ofir Sharoni, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Igor Varvaruk is a distinguished inventor whose work in measurement data analysis has led to valuable patents and advancements in technology. His contributions continue to influence the field and inspire future innovations.