Company Filing History:
Years Active: 2020-2021
Title: Ichiro Shiono: Innovator in α-ray Measurement and Sputtering Technology
Introduction
Ichiro Shiono is a notable inventor based in Sanda, Japan. He has made significant contributions to the field of measurement devices and materials science. With a total of 2 patents to his name, Shiono continues to push the boundaries of innovation in his industry.
Latest Patents
Ichiro Shiono's latest patents include an α-ray measuring device and a method for manufacturing Ag alloy films. The α-ray measuring device features a box-shaped chamber equipped with a gas inlet and outlet, a cathode film, and a series of anode and cathode wires arranged in parallel. This innovative design allows for precise measurements of α-ray emissions. His second patent focuses on a sputtering target composed of various elements, including Cu, Sn, Sb, Mg, In, and Ti, which are crucial for the production of high-quality Ag alloy films.
Career Highlights
Shiono is currently employed at Mitsubishi Materials Corporation, where he applies his expertise in materials science and measurement technology. His work has been instrumental in advancing the company's capabilities in producing cutting-edge materials for various applications.
Collaborations
Ichiro Shiono has collaborated with talented coworkers such as Yoshinori Sawada and Yuto Toshimori. Their combined efforts have contributed to the successful development of innovative technologies within their field.
Conclusion
Ichiro Shiono stands out as a prominent inventor whose work in α-ray measurement and sputtering technology has made a significant impact. His patents reflect a commitment to innovation and excellence in materials science.