This inventor holds 13 USPTO granted patents and 2 EPO patents. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation. Active years: 2002-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
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Years Active: 2002-2019
Title: Ibrahim Abdulhalim: Innovator in Overlay Error Detection
Introduction
Ibrahim Abdulhalim is a notable inventor based in Kfar Manda, Israel. He has made significant contributions to the field of optical systems and overlay error detection, holding a total of 13 patents. His work focuses on improving the accuracy of measurements in multilayer samples, which is crucial for various applications in technology and manufacturing.
Latest Patents
One of his latest patents is titled "Apparatus and methods for detecting overlay errors using scatterometry." This invention discloses a method for determining overlay errors between at least two layers in a multiple layer sample. An imaging optical system is utilized to measure multiple optical signals from periodic targets on the sample, each having structures in different layers. The technique employs scatterometry to analyze these signals and determine overlay errors effectively. Another significant patent is related to "Periodic patterns and technique to control misalignment between two layers." This method measures misalignment errors between interlaced periodic structures by detecting the diffracted radiation from incident light, allowing for precise alignment in multilayer applications.
Career Highlights
Ibrahim has worked with prominent companies in the field, including Kla Tencor Corporation and Kla-Tencor Technologies Corporation. His experience in these organizations has contributed to his expertise in optical systems and error detection methodologies.
Collaborations
Throughout his career, Ibrahim has collaborated with notable professionals such as Michael Friedmann and Mike Adel. These partnerships have further enhanced his innovative capabilities and contributions to the field.
Conclusion
Ibrahim Abdulhalim is a distinguished inventor whose work in overlay error detection and optical systems has led to significant advancements in technology. His patents reflect a deep understanding of complex measurement techniques, making him a valuable asset in the field of innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile