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For the Inventor, By the Inventor

Gyeonggi, South Korea

Hyun Joo Hwang

This inventor holds 13 USPTO granted patents. Top assignee: Mirae Corporation. Active years: 2001-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyun Joo Hwang. Retrieved from https://idiyas.com/inventor/hyun-joo-hwang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 38.5

Average Co-Inventor Count = 1.8

ph-index = 6

Forward Citations = 88(Granted Patents)


Location History:

  • Kyungki-do, KR (2001 - 2002)
  • Kyungki-d0, KR (2003)
  • Uiwang-shi, KR (2007)
  • Kyonggi-do, KR (2004 - 2008)

Company Filing History:

goldMedal13 out of 114 
 
Mirae Corporation
 patents

Years Active: 2001-2008

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13 patents (USPTO):Explore Patents
1. 7424143 - Method for recognizing working position of a device transfer apparatus in semiconductor test handler (2008-09-09),
2. 7226270 - Apparatus for transferring semiconductor device in handler (2007-06-05),
3. 7225531 - Index head in semicondcutor device test handler (2007-06-05),
4. 7170276 - Device for compensating for heat deviation in a modular IC test handler (2007-01-30),
5. 6925706 - Index head in semiconductor device test handler (2005-08-09),
6. 6870360 - Apparatus for recognizing working height of device transfer system in semiconductor device test handler and method thereof (2005-03-22),
7. 6847202 - Apparatus for recognizing working position of device transfer system in semiconductor device test handler and method thereof (2005-01-25),
8. 6723964 - Apparatus for heating and cooling semiconductor device in handler for testing semiconductor device (2004-04-20),
9. 6528905 - Cooling apparatus for an XY gantry (2003-03-04),
10. 6469406 - Cooling apparatus for a linear motor (2002-10-22),
11. 6445977 - Carrier handling apparatus for a module IC handler, and method therefor (2002-09-03),
12. 6300691 - Linear motor with an improved cooling structure (2001-10-09),
13. 6274953 - System for preventing malfunction of a switching circuit for linear motor (2001-08-14),

Title: Innovations of Hyun Joo Hwang in Semiconductor Technology

Introduction

Hyun Joo Hwang is a prominent inventor based in Kyonggi-do, South Korea. He has made significant contributions to the field of semiconductor technology, holding a total of 13 patents. His work focuses on enhancing the efficiency and accuracy of semiconductor testing processes.

Latest Patents

One of his latest patents is a method for recognizing the working position of a device transfer apparatus in a semiconductor test handler. This innovative method involves several steps, including obtaining necessary information through an image input unit while moving the device transfer unit. It also includes comparing semiconductor device types with identifiers attached to change kits to ensure compatibility. Another notable patent is for an index head assembly in a semiconductor device test handler. This assembly allows for precise positioning of devices in test sockets and includes features such as a vacuum holding part, a heating component, and a compliance part for accurate alignment.

Career Highlights

Hyun Joo Hwang has established himself as a key figure in the semiconductor industry through his innovative patents and contributions. His work at Mirae Corporation has been instrumental in advancing semiconductor testing technologies. His inventions have improved the reliability and efficiency of testing processes, making significant impacts in the field.

Collaborations

Hyun Joo Hwang collaborates with talented individuals such as Ji Hyun Hwang and Do Hyun Kim. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Hyun Joo Hwang's contributions to semiconductor technology through his patents and collaborative efforts have positioned him as a leading inventor in the industry. His work continues to influence advancements in semiconductor testing and device handling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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