Company Filing History:
5 out of 150 
1 out of 103 Years Active: 2014-2025
Title: Innovations of Inventor Hunglin Chen
Introduction
Hunglin Chen is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor technology, holding a total of six patents. His work focuses on improving the manufacturing processes and yield predictions of semiconductor devices.
Latest Patents
One of his latest patents is titled "Method and apparatus for predicting yield of semiconductor devices." This invention outlines a method for predicting the yield of manufacturing semiconductor devices by acquiring defect data and utilizing a pre-trained yield prediction model. The model employs a neural network structure to extract defect feature vectors and classify the yield as qualified or unqualified.
Another notable patent is the "Method of detecting and measuring contact alignment shift relative to gate structures in a semiconductor device." This invention provides a method for detecting and measuring alignment shifts of contacts relative to gate structures. It involves designing a test model array, forming various doped regions and gate structures, and scanning the array with an electron-beam inspector to obtain light-dark patterns for analysis.
Career Highlights
Hunglin Chen has worked with notable companies in the semiconductor industry, including Shanghai Huali Microelectronics Corporation and Shanghai Huali Integrated Circuit Corporation. His experience in these organizations has contributed to his expertise in semiconductor device manufacturing and yield prediction.
Collaborations
He has collaborated with several professionals in his field, including coworkers Yin Long and Qiliang Ni. Their collective efforts have further advanced the innovations in semiconductor technology.
Conclusion
Hunglin Chen's contributions to semiconductor technology through his patents and career achievements highlight his role as a significant inventor in the industry. His work continues to influence the efficiency and effectiveness of semiconductor manufacturing processes.