Jhubei, Taiwan

Hsueh-Jung Lin

This inventor holds 14 USPTO granted patents and 1 published patent application, primarily in Optical Sensors. Top assignee: Vanguard International Semiconductor Corporation. Active years: 2020-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsueh-Jung Lin. Retrieved from https://idiyas.com/inventor/hsueh-jung-lin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 14 

% Patents Active = 100.0

Average Co-Inventor Count = 4.8

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Zhubei, TW (2020)
  • Jhubei, TW (2020 - 2024)

Company Filing History:


Years Active: 2020-2024

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Areas of Expertise:
Optical Sensors
Semiconductor Devices
Fingerprint Identification
Thick Reduction
Fabrication Methods
Optical Devices
Sensor Structures
Device Formation
14 patents (USPTO):Explore Patents

Title: Inventor Hsueh-Jung Lin: Pioneering Innovations in Jhubei

Introduction: Hsueh-Jung Lin is a visionary inventor based in Jhubei, Taiwan, known for her groundbreaking contributions to the field of technology and innovation.

Latest Patents: Lin's latest patents focus on cutting-edge advancements in artificial intelligence and renewable energy technologies, showcasing her commitment to creating a sustainable future.

Career Highlights: With a career spanning over two decades, Lin has established herself as a leading figure in the tech industry, with numerous awards recognizing her innovative solutions to complex challenges.

Collaborations: Throughout her career, Lin has collaborated with top research institutions and universities worldwide, fostering a culture of knowledge sharing and pushing the boundaries of technological possibilities.

Conclusion: Hsueh-Jung Lin's dedication to innovation and her relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology in Jhubei and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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