Howard Lin

Title: Howard Lin: Innovator in Electronic Testing Systems

Introduction

Howard Lin is a prominent inventor based in Boston, MA, known for his contributions to electronic testing systems. With a total of 3 patents to his name, Lin has made significant advancements in the field of device testing and memory management.

Latest Patents

One of Lin's latest patents focuses on identifying failures in device cores. This innovative system is designed for testing a device under test (DUT) that includes multiple cores. The system utilizes parallel channels to connect to various pins on the DUT, enabling the transmission of test data and the reception of measurement data. The measurement data consists of time-division-multiplexed (TDM) data, which includes successive data packets from the DUT. The system is equipped with circuitry that compares the measurement data with expected data to determine the pass/fail status of each core.

Another notable patent by Lin addresses managing memory in electronic systems. This system incorporates first and second memory, with the second memory having a greater areal density. A logic circuit is responsible for transferring test data between the two memory types while simultaneously reading or processing other test data. This efficient management of memory enhances the testing process for devices under test.

Career Highlights

Howard Lin is currently employed at Teradyne, Inc., a leading company in the field of automated test equipment. His work at Teradyne has allowed him to apply his innovative ideas and contribute to the development of advanced testing solutions.

Collaborations

Lin collaborates with talented individuals in his field, including Corbin L Champion and Jan Paul Anthonie Van Der Wagt. These partnerships foster a creative environment that drives innovation and enhances the quality of their work.

Conclusion

Howard Lin's contributions to electronic testing systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in device testing and memory management. Lin's work continues to influence the industry and pave the way for future advancements.