The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Nov. 10, 2021
Applicant:
Teradyne, Inc., North Reading, MA (US);
Inventors:
Scott D. Schaber, North Reading, MA (US);
Howard Lin, North Reading, MA (US);
Assignee:
TERADYNE, INC., North Reading, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/263 (2006.01); G06F 12/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0604 (2013.01); G06F 3/0655 (2013.01); G06F 3/0679 (2013.01); G06F 11/2635 (2013.01); G06F 12/0638 (2013.01);
Abstract
An example system includes first memory, second memory having a greater areal density than the first memory, and a logic circuit configured to move some test data from the second memory to the first memory while at least one of (i) reading other test data from the first memory or (ii) processing the other test data. The logic circuit is configured to process the other test data prior to output along a test channel. The test channel leads to a device under test (DUT) to be tested.