Hormoz Ghaziary

Title: Inventor Hormoz Ghaziary: Pioneering Innovations in X-ray Analysis

Introduction

Hormoz Ghaziary is an accomplished inventor based in Los Gatos, CA, with a remarkable portfolio that includes three patents. His work primarily focuses on innovative methods and devices for analyzing metallic layers, which have significant implications in various industrial applications.

Latest Patents

Among his latest innovations is a patented device designed for the measurement of metal sheet thickness and clad layer thickness using X-ray fluorescence analysis. This advanced device includes an X-ray source that directs a beam of polychromatic primary X-rays capable of penetrating two metal layers, resulting in the generation of chemical element-specific fluorescent X-rays. The device is equipped with a detector module that detects these fluorescent X-rays, improving detection efficiency and reducing measurement time. This technology allows for precise analysis of alloys with low concentrations of fluorescent elements, enhancing capabilities in determining cladding thickness.

Another notable patent by Ghaziary relates to a method for analyzing specimens composed of compound materials through X-ray fluorescence analysis. In this process, the invention generates a beam of primary X-rays directed at the specimen, detects specific fluorescent X-rays, and determines their intensity. By varying the electric current applied to the X-ray tube, the analysis allows for the simultaneous determination of the thickness of layers present in the specimen and the relative abundance of chemical elements within the compound material.

Career Highlights

Hormoz Ghaziary has contributed extensively to the field of materials analysis, securing his place as a notable inventor in the domain. His tenure includes work with companies such as Corus Aluminium Walzprodukte GmbH and Hoogovens Aluminum Walzprodukte, where he developed critical technologies that support advancements in aluminum processing and quality control.

Collaborations

During his career, Ghaziary has collaborated with various professionals, including Alfred Johann Peter Haszler, which has further enriched his contributions to the field. Together, they have worked on advancing methods that leverage X-ray technology for improved material evaluation.

Conclusion

Hormoz Ghaziary stands as a distinguished inventor with significant contributions to the field of X-ray analysis. His patents reflect a commitment to innovation that not only enhances measurement techniques but also provides valuable tools for industries reliant on precise material characterization. As the landscape of technology evolves, Ghaziary's work continues to inspire improvements in how materials are analyzed and utilized.