Corus Aluminium Walzprodukte Gmbh

Hoogovens Aluminum Walzprodukte

Hormoz Ghaziary

Alfred Johann Peter Haszler

A device for the measurement of the thickness of a first layer, including one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis, includes (a) an X-ray source for generating and directing a beam of polychromatic primary X-rays, the beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element; and (b) a detector module for detecting element specific fluorescent X-rays and determining an intensity thereof. In the method of using the device, the detector module for detection is placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. The device achieves an improvement in the efficiency of detection, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analyzed, for determining the thickness of a cladding.

Device for measurement of metal sheet thickness and clad layer thickness and method of use thereof

The invention relates to a method of analyzing a specimen comprising a compound material by X-ray fluorescence analysis wherein a beam of polychromatic primary X-rays is generated in an X-ray tube by conversion of electric current into X-rays, and said beam is directed at the specimen, and wherein the element specific fluorescent X-rays are selectively detected using means for detection and an intensity of said fluorescent X-rays is determined. After the electric current is applied to the X-ray tube and the intensity of element specific fluorescent X-rays is determined, a second intensity of the element specific fluorescent X-rays is determined while applying an electric current with a different value than the previous electric current, and at least the relative abundance of the chemical element present in the compound material is then determined using the values of both intensities. The thickness of the first layer can be determined simultaneously.

Method of analyzing a specimen comprising a compound material by x-ray fluorescence analysis

Method for measuring residual stress in a metallic specimen wherein, by means of an ultrasound transducer an ultrasound entry wave having a ground frequency is introduced into a surface of the metallic specimen, the ultrasound entry wave is measured by means of an entry wave detector and the succeeding ultrasound exit wave is measured by means of a exit wave detector and the measured values of the ultrasound entry and exit wave are used to determine residual stress, characterized in that, for a selected entry gate time the value of the entry convolution integral of the measured ultrasound entry wave and a periodic wave of the ground frequency is calculated and during a selected exit gate time the value of the exit convolution integral of the measured ultrasound exit wave and a periodic wave of the ground frequency is calculated and the residual stress is determined using the calculated values of the entry convolution integral and the exit convolution integral.

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Los Gatos, CA, United States of America

Hormoz Ghaziary