The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Jan. 13, 2000
Alfred Johann Peter Haszler, Vallendar, DE;
Hormoz Ghaziary, Los Gatos, CA (US);
Hoogovens Aluminum Walzprodukte, Koblenz, DE;
Abstract
Method for measuring residual stress in a metallic specimen wherein, by means of an ultrasound transducer an ultrasound entry wave having a ground frequency is introduced into a surface of the metallic specimen, the ultrasound entry wave is measured by means of an entry wave detector and the succeeding ultrasound exit wave is measured by means of a exit wave detector and the measured values of the ultrasound entry and exit wave are used to determine residual stress, characterized in that, for a selected entry gate time the value of the entry convolution integral of the measured ultrasound entry wave and a periodic wave of the ground frequency is calculated and during a selected exit gate time the value of the exit convolution integral of the measured ultrasound exit wave and a periodic wave of the ground frequency is calculated and the residual stress is determined using the calculated values of the entry convolution integral and the exit convolution integral.